Two new certifications have been recognized for some Tecsystem products and in particular : the PAC certificate for temperature control Sensors the EAC for thermal control unit compliance PAC certificate for temperature sensor The PAC is the Certificate of approval of measuring instruments, in this case of temperature sensors. Also known as a metrology certificate, […]
The new RMA procedure for obtaining the authorization to return material is NOW ON.. What is an R M A number? With the attribution of an R M A number (Return Merchandise Authorization), Tecsystem authorizes the customer to return the product. The reasons for return can be: 1) return for repair 2) return for credit […]
** We will be closed the 1st of November 2019 … wishing our customers a Happy Halloween **
In a recent article on the pages of “Transformer Technology” we talk about some of our solutions and how, starting from the basic concept of “remote temperature control”, Tecsystem has developed different technologies and protocols designed to make the transfer of data from the machine to the really simple and fast control system, increasing efficiency […]
Tecsystem is pleased to inform you of our participation to the next FISE 2019, to be held in Medellin – Colombia from 4 to 6 December. You can find us in the Yellow Pavilion – Stand AM083
TECSYSTEM: Quality and products certification Tecsystem, specialized in devices for monitoring the temperature of electric machines, bases the quality of its products not only on their intrinsic goodness, but also on the added value offered to customers thanks to the extreme care and attention placed in their certifications. ISO 9001 certification: the quality of the […]
In occasion of the 10th edition of the Italian Grand Gala Panda D’Oro Award organized by the Italian Chamber of Commerce in China (CICC), our subsidiary TECSYSTEM SHANGHAI Co. LTD has been awarded for the category “Strategy & Promotion”: for the constant commitment to design and develop “smart” products for an increasingly interconnected world. One […]